Machinery & Equipment

Share us

IEC Child Articulated Finger Probe

CX-18

Description

Purpose:
This probe is intended to simulate access to hazardous parts by children of more than 36 months and less than 14 years.

Conforms to:
Standard IEC61032-1997, IEC60529-2001, GB/T4208-2008 and UL etc.
Technology Parameter:
Knurled finger diameter: 8.6mm
Head radius: 4.3mm
Knurled finger length: 57.9mm (three knurls, 19.3mm/knurl)

Notes:
The extension of the handle represents the arm of the child. And the handle is provided with an extension 451.6mm long, and the probe should be applied with or without this extension, whichever is the more onerous condition.
Both joints shall permit movement in the same plane and the same direction through an angle of 90o..

iec test probe, test finger,

Read More

Previous

High Voltage Tester...

Previous

IEC/EN/UL 61032 Standard Test Finger...

Shenzhen Chuangxin Instruments Co., Ltd

iec test finger, spring impact hammer, gauge, lab equipment

Address: F106, Gongle Fenghe Guard, Xixiang Street, Shenzhen, China,
Shenzhen, Guangdong
China, 518000

Tel: 0086-755-13652324165
Fax: 0086-755-61577693

H5响应式定制设计
26种语言,SEO营销型网站


H5/响应式/营销型企业网站; 26种语言扩展;
覆盖: 英文、法语、德语、西班牙语、葡萄牙语、俄语、阿拉伯语、波斯语、日语、韩语
了解更多